Normal view MARC view ISBD view

True or Spurious Long Memory? A New Test

Ohanissian, Arek Et al.

True or Spurious Long Memory? A New Test 2008 - 2008 - 161-175 V. 26 Issue. 2

Subjects--Topical Terms:
Economic Statistics

Subjects--Index Terms: Regime switching;Structural change;Temporal aggregation;

Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)