Refine your search
- Availability
-
Authors
- Berridge, Damon; Cro...
- Carayannis, Elias G
- Chen, Hongwei
- Editors : Peter Bühl...
- Epstein, David B. A.
- Evans, Lawrence C.
- Gariepy, Ronald F.
- González-Mariscal, G...
- Hofmann, Markus
- Ho, Robert
- Huntington-Klein, Ni...
- Janapati, Ravichande...
- John Haywood
- Kolb, Edward W.
- Levy S.V.F.
- Murrell, Paul
- Paterson M.S.
- Pries, Kim H.; Dunn...
- Thumann, Albert; Woo...
- Wu Lixin
- Show more
- Show less
- Collections
- Item types
- Locations
-
Series
- Addison-Wesley serie...
- Advances in applied ...
- Chapman & Hall/CRC d...
- Chapman & Hall/CRC d...
- Chapman & Hall/CRC f...
- Chapman & Hall/CRC t...
- Computer Science and...
- Materials, Devices, ...
- Mathematics monograp...
- Monographs and textb...
- Quick programming
- Studies in advanced ...
- Textbook series in p...
- Textbooks in mathema...
- Texts in statistical...
- Texts in Statistical...
- Texts in Statistical...
- The R series
- The R Series
- What Every Engineer ...
- Show more
- Show less
-
Topics
- Bayesian statistical...
- Big data
- Business Analytics
- Causality (Physics)
- Computer programs
- Computer software
- Data mining
- Differential topolog...
- Environmental Exposu...
- Environmental Pollut...
- Environmental toxico...
- Insects
- Mathematical physics
- Mathematical statist...
- Mathematics
- Physics
- Probabilities
- R (Computer program ...
- Statistics
- Show more
- Show less